Applied Optics · 1977 · 55 citations · 3 references
Natural SciencesMaterials EngineeringMaterials ScienceOptical MaterialsOpticsPhotonicsDielectricsOptical Properties Of MaterialsOptical Thin FilmsRefractive IndexThin Film Optical PropertiesDielectric Optical MaterialsLaser ThresholdMaterial ReflectivityOptical ReflectanceReflectanceSiliconSilicon DioxideThin-film Optical Characterization
We measured the refractive index of layers of hafnium dioxide that were prepared by evaporation in a vacuum. It is transparent to wavelengths as short as 230 nm. Its refractive index at 300 nm was as high as 2.10 or as low as 1.90, depending upon the conditions of evaporation. Tests at Los Alamos Scientific Laboratory indicate that its laser damage threshold is approximately 2 J/cm(2) at a wavelength of 355 nm. Multilayer dielectric mirrors were prepared using hafnium dioxide and silicon dioxide. The radiant reflectance exceeded 99% at a wavelength of 320 nm.
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Reactively Evaporated Films of Scandia and Yttria
W. Heitmann · Applied Optics · 1973 · 63 citations
Natural Sciences, Materials Engineering, Materials Science +17