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The barrier height of Schottky diodes with a chemical-vapor-deposited diamond base
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Citations
14
References
1989
Year
EngineeringInternal Photoemission TechniqueThin Film Process TechnologySemiconductor DeviceBarrier HeightNanoelectronicsThin Film ProcessingMaterials ScienceSemiconductor TechnologyElectrical EngineeringChemical-vapor-deposited Diamond BaseCrystalline DefectsPhysicsDiamond-like CarbonSurface ScienceApplied PhysicsSingle-crystal DiamondSchottky DiodesThin FilmsChemical Vapor Deposition
A barrier height of 1.13±0.03 eV was measured for Al and Au rectifying contacts to p-type chemical-vapor-deposited diamond thin films using the internal photoemission technique. The results are compared with experimental data reported for Schottky barriers on single-crystal diamond.
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