Separation of bulk and surface-losses in low-loss EELS measurements in STEM - Concepedia

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Separation of bulk and surface-losses in low-loss EELS measurements in STEM

59

Citations

27

References

2006

Year

K. Andre Mkhoyan, Thomas M. Babinec, S. Maccagnano, E.J. Kirkland, J. Silcox

Ultramicroscopy

Low-loss Eels MeasurementsEngineeringInstrumentation

References

	Year	Citations

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