Publication | Closed Access
Interpreting the nonideal reverse bias C-V characteristics and importance of the dependence of Schottky barrier height on applied voltage
161
Citations
38
References
1995
Year
Electrical EngineeringSchottky Barrier HeightEngineeringElectronic EngineeringApplied PhysicsApplied VoltageC-v CharacteristicsMicroelectronicsSemiconductor Device
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