Concepedia

Publication | Closed Access

Thin-film thickness profile measurement using wavelet transform in wavelength-scanning interferometry

DOI

20

Citations

9

References

2007

Year

Young-Min Hwang, Sung-Won Yoon, Jung Hwan Kim, Souk Kim, Heui-Jae Pahk
Optics and Lasers in Engineering

References

YearCitations

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