Analysis of Admittance Data: Comparison of a Parametric and a Nonparametric Method

Physics of Semiconductor Devices

Samarth Jain, S. Radhakrishna · 1987 · 4.2K citations

Engineering, Electrical Engineering, Physics +12

Admittance spectroscopy of impurity levels in Schottky barriers

D. L. Losee · Journal of Applied Physics · 1975 · 433 citations

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Tikhonovs regularization method for ill-posed problems

Josef Honerkamp, Jürgen Weese · Continuum Mechanics and Thermodynamics · 1990 · 264 citations

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Conductance and capacitance studies in GaP Schottky barriers

G. Vincent, D. Bois, P. Pinard · Journal of Applied Physics · 1975 · 184 citations

Engineering, Electrical Engineering, Materials Science +17

Accurate determination of the free carrier capture kinetics of deep traps by space-charge methods

Dirk Pons · Journal of Applied Physics · 1984 · 177 citations

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