Publication | Closed Access
Observation of stacking faults in a scanning electron microscope by electron channelling contrast imaging
12
Citations
9
References
2011
Year
Contrast ImagingEngineeringElectron MicroscopyCrystalline DefectsPhysicsMicroscopyContrast Imaging TechniqueMicroscopy MethodApplied PhysicsScanning Probe MicroscopyMicroanalysisElectron MicroscopeScanning Electron MicroscopeInstrumentationCast Trip SteelElectron OpticMicrostructureX-ray Imaging
Abstract The electron channelling contrast imaging technique was applied in a scanning electron microscope equipped with a field emission gun and high beam current mode for imaging stacking faults, in particular in two different variants of cast TRIP steel after tensile and cyclic deformation. Besides well developed deformation bands, individual stacking faults with low dissipation width were observed in the metastable austenitic matrix.
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