Concepedia
Journal of Electronic Materials · 1990 · 13 citations · 2 references
Natural SciencesMaterials ScienceOpticsOptoelectronicsSpectroscopyNonlinear OpticsOptical ModulationOptical ModulatorsOptical SpectroscopyOptoelectronic DevicesOptoelectronic MaterialsModulation ResponseOptoelectronic Properties
2
Deep-level transient spectroscopy: A new method to characterize traps in semiconductors
D. V. Lang · Journal of Applied Physics · 1974 · 3.7K citations
Engineering, Electrical Engineering, Materials Science +16
The Si-SiO<sub>2</sub>Interface - Electrical Properties as Determined by the Metal-Insulator-Silicon Conductance Technique
E. H. Nicollian, A. Goetzberger · Bell System Technical Journal · 1967 · 1.8K citations
Engineering, Electrical Engineering, Materials Science +17