Field emission from surface‐modified heavily phosphorus‐doped homoepitaxial (111) diamond

Abstract

Abstract Field emission from heavily phosphorus‐doped homoepitaxial (111) diamonds after surface modifications are discussed. To develop a model for emission, we applied X‐ray photoelectron spectroscopy (XPS) to characterize surface properties of H‐plasma treated, oxidized and carbon‐reconstructed surfaces. In addition, reflection high energy electron diffraction (RHEED) is used to evaluate atomic arrangements. Atomic force microscopy (AFM) is used to investigate surface morphologies. From AFM, no major difference is observed between H‐terminated, oxidized and carbon reconstructed surfaces. Field emission proper‐ ties of carbon reconstructed surfaces show a lower threshold than hydrogen‐terminated or oxidized surfaces. (© 2007 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)