Wear · 1988 · 63 citations · 31 references
EngineeringMaterials EngineeringMaterials ScienceInstrumentationMetrologySurface ScienceElectron MicroscopyForm MeasurementForm MetrologySurface MetrologySurface MicroscopySurface RoughnessComparatorsMeasurement TechniquesMetrology For Surface QualityMicro-metrologyNanometer-scale MetrologyNon-contact MeasurementNoncontact Surface MeasurementOptical Surface Profilometry
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Surface Studies by Scanning Tunneling Microscopy
G. Binnig, H. Rohrer, Ch. Gerber et al. · Physical Review Letters · 1982 · 4.6K citations · Full text
Electronmicroscopy and Analysis-1981
Solar Energy · 1984 · 817 citations
Vacuum Tunneling: A New Technique for Microscopy
C. F. Quate · Physics Today · 1986 · 197 citations