A technique to mitigate impact of process, voltage and temperature variations on design metrics of SRAM Cell

A 160 mV Robust Schmitt Trigger Based Subthreshold SRAM

Jaydeep P. Kulkarni, Keejong Kim, Kaushik Roy · IEEE Journal of Solid-State Circuits · 2007 · 479 citations

Engineering, Computer Engineering, Electrical Engineering +16

Read Stability and Write-Ability Analysis of SRAM Cells for Nanometer Technologies

E. Grossar, Michele Stucchi, Karen Maex et al. · IEEE Journal of Solid-State Circuits · 2006 · 462 citations · Full text

Engineering, Computer Engineering, Electrical Engineering +17

Static Noise Margin Variation for Sub-threshold SRAM in 65-nm CMOS

Benton H. Calhoun, Anantha P. Chandrakasan · IEEE Journal of Solid-State Circuits · 2006 · 344 citations

Engineering, Computer Engineering, Electrical Engineering +17

Understanding the Effect of Process Variations on the Delay of Static and Domino Logic

Massimo Alioto, G. Palumbo, Melita Pennisi · IEEE Transactions on Very Large Scale Integration (VLSI) Systems · 2009 · 187 citations

Engineering, Computer Engineering, Electrical Engineering +17

Process variation in embedded memories: failure analysis and variation aware architecture

Amit Agarwal, Bipul C. Paul, Saibal Mukhopadhyay et al. · IEEE Journal of Solid-State Circuits · 2005 · 173 citations

Engineering, Computer Engineering, Computer Science +17