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Ongoing development of high-efficiency and high-reliability laser diodes at Spectra-Physics
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Citations
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2007
Year
EngineeringLaser ScienceMaximum PceLaser ApplicationsLaser MaterialDevice EngineeringHigh-power LasersLaser ControlSemiconductor LasersOptical PropertiesPulse PowerPulsed Laser DepositionPhotonicsElectrical EngineeringPhysicsMocvd GrowthLaser DesignSemiconductor Device FabricationAdvanced Laser ProcessingLaser-induced BreakdownApplied PhysicsHigh-reliability Laser DiodesLaser Damage
Ongoing optimization of epitaxial designs, MOCVD growth processes, and device engineering at Spectra-Physics has yielded significant improvement in both power conversion efficiency (PCE) and reliable power, without compromising manufacturability in a high-volume production environment. Maximum PCE of 72.2% was measured at 25 °C for 976- nm single-emitter devices with 3-mm cavity length. 928 W continuous-wave (CW) output power has been demonstrated from a high-efficiency (65% maximum PCE) single laser bar with 5-mm cavity length and 77% fill factor. Eight-element laser bars (976 nm) with 100&mgr;m-wide emitters have been operated at >148 W CW, corresponding to linear power densities at the facet >185 mW/&mgr;m. Ongoing life-testing, in combination with stepped stress tests, indicate rates of random failure and wear-out are well below those of earlier device designs. For operation near 800 nm, the design has been optimized for high-power, high-temperature applications. The highest PCE for water-cooled stacks was 54.7% at 35°C coolant temperature.
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