Characterization of microstructure and defects in epitaxial ZnO films on Al2O3 substrates by transmission electron microscopy - Concepedia

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Characterization of microstructure and defects in epitaxial ZnO films on Al2O3 substrates by transmission electron microscopy

26

Citations

17

References

2008

Year

Jae Wook Lee, Seok Kyu Han, Soon‐Ku Hong, Jeong Yong Lee, Takafumi Yao

Journal of Crystal Growth

Materials ScienceAluminium NitrideEngineeringTransmission Electron MicroscopyOxide ElectronicsAl2o3 SubstratesApplied PhysicsGallium OxideThin FilmsMolecular Beam EpitaxyEpitaxial GrowthEpitaxial Zno Films

References

	Year	Citations

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