Publication | Closed Access
The effect of argon pressure, residual oxygen and exposure to air on the electrical and microstructural properties of sputtered chromium thin films
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Citations
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References
2011
Year
Materials ScienceMicrostructural PropertiesElectrical EngineeringMaterial AnalysisEngineeringSurface ScienceApplied PhysicsResidual OxygenArgon PressureThin FilmsChemical DepositionChemical Vapor DepositionThin Film ProcessingElectrical Insulation
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