Publication | Closed Access

Measurement of indium concentration profiles and segregation efficiencies from high-angle annular dark field-scanning transmission electron microscopy images

EngineeringElectron MicroscopyPhysicsMicroscopyElectron SpectroscopyScanning Probe MicroscopySurface ScienceApplied PhysicsIndium Concentration ProfilesMicroanalysisElectron MicroscopeInstrumentationSegregation Efficiencies