Journal of Applied Physics · 1996 · 34 citations · 15 references
Natural SciencesMaterials SciencePhysicsCondensed Matter PhysicsMaterials PhysicsThin FilmsMetal Oxide NanomaterialsNanomaterial CharacterizationOxide SemiconductorsSemiconductor NanomaterialsThin-film MaterialsTransmission Electron MicroscopyHigh-resolution Electron MicroscopyHigh-resolution Transmission Electron MicroscopyNanocrystalline Thin FilmsNanostructured OxidesThin Oxide FilmsThin Oxide LayersTin OxidesTwin Boundaries
Growth twins in nanocrystalline SnO2 thin films with grain size 5–50 nm have been investigated by high-resolution transmission electron microscopy. They show the {101}〈101〉 geometry, metal atom mirror symmetry, and slight distortion of oxygen atoms. Multiple twins and step twin boundaries with a density about 1015 m−2 were frequently observed in the films. It appears there are tin interstitials at step twin boundaries and, hence, electronic donors associated with the interstitials.
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<i>Experimental High-Resolution Electron Microscopy</i>
J. C. H. Spence, Albert V. Crewe · Physics Today · 1981 · 716 citations
Sensors: A Comprehensive Survey
Peter Hauptmann · Measurement Science and Technology · 1996 · 493 citations