Sensitivity analysis of two-spectrum separation of surface and bulk components of minority carrier lifetimes

Quasi-steady-state photoconductance, a new method for solar cell material and device characterization

Ronald A. Sinton, A. Cuevas, M.F. Stuckings · 1996 · 497 citations

Engineering, Electrical Engineering, Materials Science +17

Analysis of the interaction of a laser pulse with a silicon wafer: Determination of bulk lifetime and surface recombination velocity

Keung L. Luke, Li‐Jen Cheng · Journal of Applied Physics · 1987 · 243 citations

Engineering, Electrical Engineering, Materials Science +17

On the use of a bias-light correction for trapping effects in photoconductance-based lifetime measurements of silicon

Daniel Macdonald, Ronald A. Sinton, Andrés Cuevas · Journal of Applied Physics · 2001 · 84 citations · Full text

Engineering, Electrical Engineering, Materials Science +16

Electronic passivation of silicon surfaces by halogens

Hichem M’Saad, Jurgen Michel, J. J. Lappe et al. · Journal of Electronic Materials · 1994 · 76 citations

Engineering, Materials Engineering, Materials Science +14

Recombination at the silicon nitride/silicon interface

J. R. Elmiger, R. Schieck, M. Kunst · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 1997 · 48 citations

Engineering, Materials Engineering, Materials Science +17