Physical Review Letters · 1994 · 198 citations · 17 references
Natural SciencesMaterials SciencePhysicsCondensed Matter PhysicsSolid State PhysicsThermodynamicsPhase TransitionsSilicon MaterialsStates Of MatterSurface PhysicsThermal Properties Of SemiconductorsEquilibriumScanning Electron MicroscopySilicon PhysicsSilicon Surface ScienceStep EdgesSurface RougheningTemperature DependenceThermal Fluctuations
From low-energy electron microscopy measurements of step fluctuations and equilibrium 2D island shapes on Si(001), We determine the temperature dependence of the ${S}_{A}$ and ${S}_{B}$ step edge stiffnesses, free energies, and mobilities. A capillary wave analysis of step stiffnesses is in quantitative agreement with the 2D island shapes, demonstrating the direct relation between equilibrium thermal fluctuations and equilibrium structure. The analysis also suggests that step free energies vanish at \ensuremath{\sim}1200\ifmmode^\circ\else\textdegree\fi{}C, providing direct evidence for a roughening transition. The combined exploration of step dynamics and equilibrium island shapes yields new insight into the basic thermodynamics of Si(001).
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M. Zinke-Allmang, L. C. Feldman, Marcia H. Grabow · Surface Science Reports · 1992 · 660 citations
Direct determination of step and kink energies on vicinal Si(001)
B. S. Swartzentruber, Y. W. Mo, R. Kariotis et al. · Physical Review Letters · 1990 · 342 citations