Characteristics of the beam line at the Tokyo electron beam ion trap

Abstract

A new beam line has been constructed to make various experiments with highly charged ions produced in an electron beam ion trap. The characteristics of the beam line are reported. Ions are extracted upward into the beam line and are deflected horizontally and analyzed for the charge states by a double-focusing magnet. To obtain sufficient intensity, several electrostatic lenses are located. A quadrupole lens is used to correct the distorted beam shape before an entrance slit of the magnet. Ions are accelerated during the passing of the analyzing magnet to obtain the higher mass resolution. Trajectories were calculated by a ray-tracing program and matrix multiplication for lens actions. Preliminary results are shown here for investigation of characteristics of extracted ions.