Concepedia

A New Versatile Electron-Beam Ion Trap

F. J. Currell, J Asada, Koichi Ishii, Arimichi Minoh, Kenji Motohashi, Nobuyuki Nakamura, Kazou Nishizawa, Shunsuke Ohtani, Kiyohiko Okazaki, Makoto Sakurai,

Journal of the Physical Society of Japan · 1996 · 112 citations · 22 references

DOI

Concepts

Abstract

We have constructed an electron-beam ion trap (EBIT) to facilitate the creation and study of highly charged ions. After a brief introduction to EBITs in general, we describe the design of the new device, highlighting its unique features. Some preliminary results are presented which demonstrate the devices capability to produce and study highly charged ions.

References

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