Ellipsometric studies of the oxidation kinetics of Cu particles supported on oxidised Si(100)

Handbook of chemistry and physics

Journal of the Franklin Institute · 1930 · 11.7K citations

Natural Sciences, Chemistry, Physics +8

<i>Ellipsometry and Polarized Light</i>

R. M. A. Azzam, N. M. Bashara, Stanley S. Ballard · Physics Today · 1978 · 4.3K citations

Natural Sciences, Physics, Optics +13

Practical surface analysis

Vacuum · 1994 · 3.3K citations

The Evolution of Silicon Wafer Cleaning Technology

Werner Kern · Journal of The Electrochemical Society · 1990 · 1.7K citations

Engineering, Electrical Engineering, Materials Science +17

Fundamentals of surface and thin film analysis

L. C. Feldman, James W. Mayer, F. Adams · Analytica Chimica Acta · 1989 · 911 citations

Natural Sciences, Materials Engineering, Materials Science +12