IMD—Software for modeling the optical properties of multilayer films

TLDR

The paper describes a computer program called IMD. IMD models the optical properties of multilayer films—reflectance, transmittance, and electric‑field intensities—using a graphical interface that supports up to eight independent variables and nonlinear least‑squares parameter estimation. The authors present computation methods and a user interface, demonstrating IMD’s unique modeling, fitting, and visualization capabilities through numerous examples. © 1998 American Institute of Physics.

Abstract

A computer program called IMD is described. IMD is used for modeling the optical properties (reflectance, transmittance, electric-field intensities, etc.) of multilayer films, i.e., films consisting of any number of layers of any thickness. IMD includes a full graphical user interface and affords modeling with up to eight simultaneous independent variables, as well as parameter estimation (including confidence interval generation) using nonlinear, least-squares curve fitting to user-supplied experimental optical data. The computation methods and user interface are described, and numerous examples are presented that illustrate some of IMD’s unique modeling, fitting, and visualization capabilities. © 1998 American Institute of Physics.