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Thermally tunable optical constants of vanadium dioxide thin films measured by spectroscopic ellipsometry

Ii-vi SemiconductorTransition Metal ChalcogenidesOptical MaterialsTunable Optical ConstantsEngineeringOptical PropertiesSpectroscopyNatural SciencesApplied PhysicsSpectroscopic EllipsometryChemistryThin FilmsOptical SpectroscopyOptoelectronicsSpectroscopic PropertyThin Film Processing