The use of a Spherically Curved Crystal Spectrometer for X-ray Measurements on Electron Beam Ion Trap

Abstract

Spherically curved crystal spectrometers are demonstrated for use on an Electron Beam Ion Trap (EBIT) for the first time. Such spectrometers are characterized by high light collection efficiency and relative insensitivity to source position, simultaneously, giving them an advantage that no X-ray spectrometer previously used on an EBIT has had. One of the spectrometer crystals tested is composed of mica, giving it the additional advantage that it can be used with reasonable efficiency up to very high order, allowing spectra to span a broad wavelength range from 0.5 Ångstroms to 20 Ångstroms. Spectra from Ne-like barium and He-like argon are presented.