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III-V diluted magnetic semiconductor: Substitutional doping of Mn in InAs
78
Citations
9
References
1996
Year
Magnetic SemiconductorX-ray SpectroscopyEngineeringSemiconductor DeviceSemiconductorsMagnetismMn ImpuritiesQuantum MaterialsMn AtomsMolecular Beam EpitaxyEpitaxial GrowthMaterials ScienceSemiconductor TechnologyPhysicsCrystalline DefectsSemiconductor MaterialApplied PhysicsCondensed Matter PhysicsMagnetic Semiconductors
Local structures around Mn in ${\mathrm{In}}_{1\mathrm{\ensuremath{-}}\mathit{x}}$${\mathrm{Mn}}_{\mathit{x}}$As films grown by molecular-beam epitaxy have been studied by using Mn K-edge extended x-ray-absorption fine-structure (EXAFS) technique. Substitution of Mn atoms for the In sites is found in samples either grown at low substrate temperatures (near 200 \ifmmode^\circ\else\textdegree\fi{}C) or with a low Mn concentration (about 1 at. %). This result represents a significant extension of an earlier EXAFS study and serves as direct experimental evidence for III-V diluted magnetic semiconductors obtained by substitutional doping of Mn impurities in InAs. \textcopyright{} 1996 The American Physical Society.
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