Single-Reflection Attenuated Total Reflection of Organic Monolayers on Silicon

Internal Reflection Spectroscopy

Paul A. Wilks, Tomas Hirschfeld · Applied Spectroscopy Reviews · 1967 · 1.5K citations

Natural Sciences, Physics, Analytical Chemistry +1

Trialkylsilane Monolayers Covalently Attached to Silicon Surfaces:  Wettability Studies Indicating that Molecular Topography Contributes to Contact Angle Hysteresis

Alexander Y. Fadeev, Thomas J. McCarthy · Langmuir · 1999 · 376 citations

Natural Sciences, Materials Engineering, Materials Science +17

Effective Thickness of Bulk Materials and of Thin Films for Internal Reflection Spectroscopy

N. J. Harrick, F. K. Du Pré · Applied Optics · 1966 · 168 citations

Natural Sciences, Materials Engineering, Materials Science +16

Infrared reflection spectroscopy of the SiO2-silicon interface

J. E. Olsen, Fumio Shimura · Journal of Applied Physics · 1989 · 98 citations

Natural Sciences, Materials Engineering, Materials Science +17

Infrared spectroscopy of thin silicon dioxide on silicon

J. E. Olsen, Fumio Shimura · Applied Physics Letters · 1988 · 89 citations

Natural Sciences, Materials Engineering, Materials Science +17