Publication | Closed Access
Comparison of techniques for measuring both compressive and tensile stress in thin films
147
Citations
5
References
1993
Year
Materials ScienceEngineeringCompression (Physics)Applied PhysicsStressstrain AnalysisTensile StressResidual StressThin Film DevicesThin Film Process TechnologyThin FilmsMechanics Of MaterialsHigh Strain Rate
| Year | Citations | |
|---|---|---|
Page 1
Page 1