Publication | Closed Access
Conductivity Studies in Europium Oxide
236
Citations
24
References
1972
Year
Optical MaterialsEngineeringEuropium OxideChemistryCharge TransportOxygen VacancyElectrical BehaviorOptical PropertiesCharge Carrier TransportElectrical EngineeringPhysicsOxide ElectronicsConduction MechanismsSemiconductor MaterialElectrical PropertyNatural SciencesApplied PhysicsOptoelectronicsElectrical Insulation
The electrical and optical properties of EuO are studied in order to help determine conduction mechanisms. A strong relationship between growth parameters and electrical behavior is noted. Free-carrier absorption below the band edge in energy is observed in moderately conducting crystals. By comparing optical and electrical results, an experimental determination is made of carrier-density and scattering-time contributions to resistivity behavior. The carrier-density variations are explained in terms of an earlier proposed model which is developed here. The model consists of a donor-trap level, believed to be caused by an oxygen vacancy, which is above the conduction-band edge at low temperature, but crosses below it (near 50 \ifmmode^\circ\else\textdegree\fi{}K) with increasing temperature. Magnetoresistance and pressure results are presented which strongly support the model.
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