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Evaluation of the ruggedness of power DMOS transistor from electro-thermal simulation of UIS behaviour

Device ModelingElectrical EngineeringPower Dmos TransistorEngineeringSemiconductor DeviceBias Temperature InstabilityElectro-thermal SimulationComputer EngineeringPower Semiconductor DeviceElectronic PackagingPower ElectronicsMicroelectronicsThermal EngineeringHeat TransferUis BehaviourCircuit Simulation