Raman spectroscopy—A versatile tool for characterization of thin films and heterostructures of GaAs and AlxGa1−xAs - Concepedia

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Raman spectroscopy—A versatile tool for characterization of thin films and heterostructures of GaAs and AlxGa1−xAs

216

Citations

18

References

1978

Year

G. Abstreiter, E. Bauser, A. Fischer, K. Ploog

Applied Physics A

Materials ScienceSemiconductorsEngineeringApplied PhysicsMultilayer HeterostructuresThin FilmsOptical CharacterizationCompound Semiconductor

References

	Year	Citations

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