Atomic steps on Si{100} and step dynamics during sublimation studied by low-energy electron microscopy

Stabilities of single-layer and bilayer steps on Si(001) surfaces

D. J. Chadi · Physical Review Letters · 1987 · 899 citations

Materials Science, Surface Characterization, Engineering +12

Copper Precipitation on Dislocations in Silicon

W. C. Dash · Journal of Applied Physics · 1956 · 461 citations

Materials Science, Materials Engineering, Engineering +15

Growth and perfection of crystals

W. van Emde Boas · Journal of Physics and Chemistry of Solids · 1959 · 440 citations

Materials Science, Engineering, Crystal Material +5

Transformations on clean Si(111) stepped surface during sublimation

A. L. Aseev, A.B. Krasilnikov, S. I. Stenin · Surface Science · 1989 · 436 citations

Engineering, Surface Analysis, Surface Science +4

An analytical reflection and emission UHV surface electron microscope

W. Telieps, E. Bauer · Ultramicroscopy · 1985 · 324 citations

Analytical Reflection, Engineering, Electron Microscopy +6