X-Ray Attenuation in Silicon and Germanium in the Energy Range 25 to 50 keV

Abstract

Abstract The X-ray attenuation coefficients of silicon and germanium single crystals have been measured using an energy-dispersive method with particular emphasis on the energy range 25 to 50 keV. The experimental results are compared with theoretical calculations of the photoelectric absorption as well as the attenuation due to the Compton scattering and thermal diffuse scattering.