Characterization of Ta2O5 layers by electron spectroscopy for chemical analysis rutherford backscattering spectrometry, nuclear reaction analysis and optical methods - Concepedia

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Characterization of Ta2O5 layers by electron spectroscopy for chemical analysis rutherford backscattering spectrometry, nuclear reaction analysis and optical methods

38

Citations

2

References

1989

Year

K. Gu ̈rtler, K. Bange, W. Wagner, Florian Rauch, Harald Hantsche

Thin Solid Films

Materials ScienceAtomic Emission SpectroscopyElectron SpectroscopyNatural SciencesSpectroscopyTa2o5 LayersChemical Analysis RutherfordChemistry

References

	Year	Citations

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