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Phononless radiative recombination of indirect excitons in a Si/Ge type-II quantum dot
124
Citations
7
References
1997
Year
Optical MaterialsEngineeringOptoelectronic DevicesSemiconductor NanostructuresSemiconductorsLuminescence SpectraSi Quantum DotQuantum MaterialsPhononless Radiative RecombinationPhononless OriginsCompound SemiconductorMaterials SciencePhotoluminescencePhysicsCrystalline DefectsQuantum DeviceOptoelectronic MaterialsIndirect ExcitonsApplied PhysicsPhononOptoelectronics
Phononless radiative recombination is observed in luminescence spectra of Ge quantum wells decorated by self-organized Stranski–Krastanow (S–K) dots grown on Si (100). External uniaxial tensile stress along [011] allows the discrimination of phonon-missing optical transitions. The phononless recombination is attributed to a dipole-allowed k diagonal Δ1-Γ25′ interband transition involving the hole in the Ge wetting layer and the electron in a Si quantum dot encompassed by large S–K dots. The weak oscillator strength of the phononless recombination is evidenced by its slow decay kinetics. The results indicate that low-lying broad band features due to S–K dots are also of phononless origins.
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