Applied Physics Letters · 2002 · 113 citations · 18 references
EngineeringMaterials EngineeringMaterials ScienceElectronic MaterialsOptoelectronicsSemiconductor MaterialsLight-emitting DiodesLuminescent MaterialsOptoelectronic MaterialsOrganic Electronic MaterialsOrganic SemiconductorsSemiconductor ReliabilityCurrent DensityGlass TransitionGlass Transition TemperatureGreen Light-emitting DiodesHalf-life NormalizationLuminanceMaterial Degradation MechanismsOrganic Light-emitting Diodes
We measured luminance decay and half life for green organic light-emitting diodes composed of materials with high glass transition temperature. The devices were driven at dc, constant current density ranging from 3.8 to 130 mA/cm2 at 25, 85, and 120 °C. The shapes of the luminance decay curves were compared by redrawing the curves on a time scale normalized by each half life. Temperature and drive current shortened the half life. However, the normalized decay curve of the device driven at 120 °C had the same shape as that of the device driven at 25 °C. Drive current also left the shape of the decay curves unchanged. Therefore, we conclude that the temperature and drive current do not change the relative contribution of multiple degradation mechanisms.
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Organic electroluminescent diodes
Chak Wah Tang, S. A. VanSlyke · Applied Physics Letters · 1987 · 14.3K citations
Natural Sciences, Materials Engineering, Materials Science +17
Degradation Mechanism of Small Molecule-Based Organic Light-Emitting Devices
Hany Aziz, Zoran D. Popović, Nan‐Xing Hu et al. · Science · 1999 · 837 citations
Reliability and degradation of organic light emitting devices
P. E. Burrows, Vladimir Bulović, Stephen R. Forrest et al. · Applied Physics Letters · 1994 · 737 citations