Journal of Applied Physics · 1975 · 23 citations · 2 references
Natural SciencesMaterials EngineeringMaterials ScienceMetrologyOptical MaterialsOpticsInterferometryOptical MetrologyInterferometric MeasurementMicrospheresOptical Thickness MeasurementWall Thickness MonitoringWhite-light Interferometry
A simple interferometric technique using both a white-light and a monochromatic-light source can be used to measure the wall thickness of hollow glass microspheres to better than 0.05 μm. The entire procedure requires only a few minutes per sphere and can easily be made to take into account the effects of any gas with which the ball is filled.
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