Imaging devices using the charge-coupled concept

TLDR

The state of the art for linear and area CCD arrays, including TDI and CID techniques, and their applications in infrared imaging are reviewed. The paper presents a unified analytical treatment of the electrostatic and dynamic design of CCDs. The authors analyze clocking methods, driver and on-chip power dissipation, noise source properties, and low‑noise signal extraction techniques. The study details low‑noise signal extraction methods and presents trade‑offs and performance predictions for area‑array CCDs.

Abstract

A unified treatment of the basic electrostatic and dynamic design of charge-coupled devices (CCD's) based on approximate analytical analysis is presented. Clocking methods and tradeoffs are discussed. Driver power dissipation and on-chip power dissipation are analyzed. Properties of noise sources due to charge input and transfer are summarized. Low-noise methods of signal extraction are discussed in detail. The state of the art for linear and area arrays is presented. Tradeoffs in area-array performance from a systems point of view and performance predictions are presented in detail. Time delay and integration (TDI) and the charge-injection device (CID) are discussed. Finally, the uses of the charge-coupled concept in infrared imaging are discussed.