Proceedings of the IEEE · 1975 · 249 citations · 15 references
EngineeringElectrical EngineeringBiomedical ImagingLow-power DesignMicroelectronicsCharge-coupled DevicesDetector TechnologyDigital Image ProcessingImage ProcessingImage SensorsLow-noise Circuit DesignCharge InjectionCharge Injection DevicesCharge IntegrationClocking SchemesDynamic Power DissipationLow-noise DesignNoise SourcesNoise Sources In Detectors
The state of the art for linear and area CCD arrays, including TDI and CID techniques, and their applications in infrared imaging are reviewed. The paper presents a unified analytical treatment of the electrostatic and dynamic design of CCDs. The authors analyze clocking methods, driver and on-chip power dissipation, noise source properties, and low‑noise signal extraction techniques. The study details low‑noise signal extraction methods and presents trade‑offs and performance predictions for area‑array CCDs.
A unified treatment of the basic electrostatic and dynamic design of charge-coupled devices (CCD's) based on approximate analytical analysis is presented. Clocking methods and tradeoffs are discussed. Driver power dissipation and on-chip power dissipation are analyzed. Properties of noise sources due to charge input and transfer are summarized. Low-noise methods of signal extraction are discussed in detail. The state of the art for linear and area arrays is presented. Tradeoffs in area-array performance from a systems point of view and performance predictions are presented in detail. Time delay and integration (TDI) and the charge-injection device (CID) are discussed. Finally, the uses of the charge-coupled concept in infrared imaging are discussed.
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Charge Coupled Semiconductor Devices
W. S. Boyle, George Smith · Bell System Technical Journal · 1970 · 948 citations
M.F. Tompsett · Journal of Vacuum Science and Technology · 1972 · 246 citations