Rapid and Precise Detection of Latent Infections of Wheat Stripe Rust in Wheat Leaves using Loop‐Mediated Isothermal Amplification

Abstract

Abstract Wheat stripe rust caused by Puccinia striiformis f.sp. tritici ( Pst ) is one of the most important diseases of wheat worldwide. Detection of latent infection in leaves is critical for estimating the initial inoculum potential of epidemics. A loop‐mediated isothermal amplification (LAMP) assay was developed and evaluated for the detection of Pst DNA in spores and wheat seedlings with latent infections. LAMP assay could detect as low as 2 pg/μl template DNA and detect latent infections from leaves as early as 24 h after inoculation. This provides a rapid and accurate method of estimating latent infection levels.