Microwave properties of ceramic materials

Abstract

A test method used in the characterization of ceramic material systems in the 1-to-15 GHz range is described. Data are presented on the dielectric constant and loss tangent or attenuation of a low-temperature cofired ceramic, a gold conductor system, and a low-dielectric-constant thick-film stratified dielectric system with gold conductors. The test method uses simple microstrip circuit construction techniques to obtain electrical property data more representative of end-use circuit applications than bulk material measurements and readily available fixturing components to characterize microwave properties over a broad frequency range. Applying this technique to well-known material systems has resulted in excellent agreement with manufacturers' data and data from other test methods.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">&gt;</ETX>