1984 · 23 citations · 6 references
EngineeringComputer EngineeringComputer ScienceEmbedded SystemsMemoryBuilt-in Self-testDesign For TestabilityEmbedded Memory BlocksMemory DevicesCombinational Logic DesignEmbedded MemoryEmbedded TestEmbedded TestabilityEmbedded TestingMemory TestRandom-access MemoryStuck-at Fault Testing
Two measures are developed for the quality of a random test with respect to the detection of stuck-at storage cells in a memory whose inputs are embedded within combinational logic. Suggestions are made for improving the test performance by modifying the embedding logic.
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Built-in logic block observation techniques
B. Koenemann · Medical Entomology and Zoology · 1979 · 445 citations
J. Savir, Gary S. Ditlow, Paul H. Bardell · IEEE Transactions on Computers · 1984 · 282 citations