2002 · 23 citations · 4 references
EngineeringElectrical EngineeringMaterials ScienceAgingPower ElectronicsThin FilmsAging EffectsDevice ReliabilityDurabilityMaterial DegradationMaterial Degradation AssessmentMaterial DeteriorationAging BehaviorAging DegradationAging Degradation AnalysisAging MechanismsDielectric AgingFailure Mode AssessmentFilm CapacitorsWeibull Model
Aging of MPPF capacitors have been studied in this paper with the aim to improve their reliability regarding their design. The statistical approach showed that the failure mode may be represented by two parameter Weibull distribution and the experimental approach proved that a long capacitor deteriorates faster than a plate-shaped capacitor having the same features.
4