PICS · 2002 · 14 citations · 4 references
EngineeringManufacturing EngineeringDigital ImagingMetrologyQuality EngineeringDefect CharacterizationDefect ClassificationDefect DetectionDefectsManufacturing DefectsPrint ProductionDefect AnalysisPrint Quality InspectionPrinting DefectsWavelet AnalysisWavelet-based Analysis
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Quantification of Banding, Streaking and Grain in Flat Field Images.
Paul J. Kane, Theodore Bouk, Peter D. Burns et al. · 2000 · 23 citations
Measuring Visual Threshold of Inkjet Banding.
Chengwu Cui, Dingcai Cao, Shaun Love · 2001 · 13 citations