VUV-ellipsometry on BexZn1−xSe and BeTe - Concepedia

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VUV-ellipsometry on BexZn1−xSe and BeTe

31

Citations

29

References

1999

Year

K. Wilmers, T. Wethkamp, N. Esser, Christoph Cobet, W. Richter, V. Wagner, H.‐J. Lugauer, Frank Fischer, T. Gerhard, M. Keim,

Journal of Electronic Materials

Physical ChemistrySpectroscopic PropertyApplied PhysicsEngineering

References

	Year	Citations

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