Zeitschrift für Metallkunde · 2003 · 21 citations · 28 references
EngineeringMaterials SciencePhysicsInterface ScienceNanotechnologySurface ScienceElectron MicroscopyNanomaterial CharacterizationSemiconductor InterfacesSemiconductor SurfacesSurface PhysicsTransmission Electron MicroscopyAberration CorrectionsLocal Electronic StructureLocal StructureOptical PropertiesScanning Electron MicroscopyScanning Transmission Electron MicroscopySurface Optical PropertiesTransmission Electron Microscopy Of Interfaces
Abstract The sub-Angstrom probe of an aberration-corrected scanning transmission electron microscope will enable imaging and analysis of nanostructures and interfaces with unprecedented resolution and sensitivity. In conjunction with first-principles theory, new insights are anticipated into the atomistic processes of growth and the subtle link between structure and functionality. We present initial results from the aberration-corrected microscopes at Oak Ridge National Laboratory that indicate the kinds of studies that will become feasible in the near future. Examples include (1) the three-dimensional location and identification of individual dopant and impurity atoms in semiconductor interfaces, and their effect on local electronic structure; (2) the accurate reconstruction of surface atomic and electronic structure on nanocrystals, and the effect on optical properties; and (3) the ability to distinguish which configurations of catalyst atoms are active, and why.
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