Publication | Open Access
Structural and electrical characterizations of crack-free BaSi2 thin films fabricated by thermal evaporation
35
Citations
23
References
2015
Year
Materials ScienceElectrical EngineeringMaterial AnalysisEngineeringElectrical CharacterizationsNanoelectronicsApplied PhysicsSemiconductor MaterialThermal EvaporationThin FilmsChemical Vapor DepositionThin Film Processing
| Year | Citations | |
|---|---|---|
Page 1
Page 1