Optimized entropic uncertainty for successive projective measurements

Abstract

We focus here on the uncertainty of an observable $Y$ caused by a precise measurement of $X$. We illustrate the effect by analyzing the general scenario of two successive measurements of spin components $X$ and $Y$. We derive an optimized entropic uncertainty limit that quantifies the necessary amount of uncertainty observed in a subsequent measurement of $Y$. We compare this bound to recently derived error-disturbance relations and discuss how the bound quantifies the information of successive quantum measurements.