A novel test generation approach for parametric faults in linear analog circuits

Abstract

While analog test generation tools are still in their infancy, the corresponding tools in the digital domain have reached a fair degree of maturity and acceptance. Recognizing this fact, we propose a novel test generation method for linear analog circuits that employs well established digital test software to generate time-domain tests for analog parametric faults. We transform the analog circuit to an equivalent digital circuit, and target only those stuck-at faults in the digital circuit that could possibly capture parametric failures in the original analog circuit. Hence, the sequence of digital test vectors obtained from any test generator represents a test waveform for the analog parametric faults. The technique is illustrated using examples that show this to be a simple, yet attractive alternative to costlier simulation-based analog test generation approaches.