X-ray Pinpoint Structural Measurement for Nanomaterials and Devices at BL40XU of the SPring-8

Abstract

The pulse characteristic and high coherent x‐ray beam of SPring‐8 allow us to investigate dynamics of chemical reactions and phase transition of materials caused by applied field. In order to realize such direct investigation, “x‐ray pinpoint structural measurement”, which is the advanced x‐ray measurement technique in nanometer spatial scale and/or pico‐second time scale, is being developed at SPring‐8. The features of “x‐ray pinpoint structural measurement” technique are, 1) spatial resolution: ∼ 100 nm, 2) time resolution: ∼ 40 ps, and 3) measurement under the photo‐irradiation, electric field, magnetic field, high pressure and active devices. Using this technique, we will explore the novel concept and new phenomena for nanomaterials and/or devices, and also demonstrate their validity.