Study of CF<sub>4</sub>, C<sub>2</sub>F<sub>6</sub>, SF<sub>6</sub> and NF<sub>3</sub> Decomposition Characteristics and Etching Performance in Plasma State

Kunihiko Koike, Tatsuo Fukuda, Shizuichi Fujikawa, M. Saeda

Japanese Journal of Applied Physics · 1997 · 24 citations · 0 references

Concepts

Abstract

The decomposition characteristics and etching performances of CF 4 , C 2 F 6 , SF 6 and NF 3 in their plasma state were studied for use as self-cleaning gases in plasma-enhanced chemical vapor deposition (PE-CVD) equipment. The study revealed several important characteristics of these gases. The plasma decomposition ratios are in the order of C 2 F 6 &gt;NF 3 ≫SF 6 &gt;CF 4 . A large amount of CF 4 is formed as a result of the decomposition of C 2 F 6 . The decomposition ratio of these gases is strongly dependent on the plasma power density, but not appreciably on the temperature in the range of practical use. Moreover, the rate of F decrease of etchant through the plasma chamber appears to strongly correlate with the etch rate.