Publication | Open Access
MAXIMUM: Status of the scanning photoelectron microscope (abstract)
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Citations
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References
1989
Year
EngineeringMicroscopyElectron OpticX-ray ImagingBeam OpticMicroscopy MethodOptical PropertiesOptical DiagnosticsComputational ImagingInstrumentationOptical SystemsRadiation ImagingSpatial ResolutionMaximum FlexibilityHealth SciencesPhysicsPhotoelectric MeasurementIndependent EnergyPhotoelectron MicroscopeScanning Probe MicroscopyApplied PhysicsBiomedical ImagingElectron MicroscopeOptical System AnalysisX-ray Optic
The construction of the MAXIMUM scanning photoelectron microscope has been recently funded. A preliminary description has already been reported.1 We will present the final construction layout of the system, with particular attention dedicated to the optical components. Briefly, the system is based on a variable line spaced grating monochromator used to filter the radiation emitted by a 30 poles undulator installed at Aladdin. The radiation is then refocussed on a pinhole that is suitably demagnified by a Schwartzschild objective to a spot of less than 0.1 μm. The sample is located at the focus and mechanically rastered. The photoelectrons are energy analyzed by a commercial cylindrical mirror analyzer. The main characteristics of the system will be (1) high flux, (2) independent energy and spatial resolution, and (3) independent photon and electron energy resolution. All the components are fully decoupled thus allowing maximum flexibility. Detailed ray-tracing and flux estimates based on our new undulator modelling codes2 will be presented.
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